NSN 6625-01-592-2285
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-592-2285 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: PROTRACK SCANNER I, 6625-01-592-2285, 01-592-2285, 6625015922285, 015922285
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | FEB 28, 2011 | 01-592-2285 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-592-2285
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| PROTRACK SCANNER I | 57705 | HUNTRON INCDBA HUNTRON INSTRUMENTS |
Technical Data | NSN 6625-01-592-2285
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | TROUBLESHOOTING |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| DEPTH | 15.000 INCHES NOMINAL |
| HEIGHT | 4.500 INCHES NOMINAL |
| WIDTH | 11.600 INCHES NOMINAL |
| PART NAME ASSIGNED BY CONTROLLING AGENCY | PROTRACK I |