NSN 6625-01-620-1148

Part Details | ELECTRONIC SYSTEMS TEST SET

6625-01-620-1148 A test set specifically designed for use in making examinations and providing discrete evaluations of the over-all performance of a system(s) or subsystem(s). Excludes TEST SET (1), ANTENNA SYSTEM; TEST SET (1), FIRE CONTROL SYSTEM; TEST SET (1), FLIGHT CONTROL SYSTEM; and TEST SET (1), TELEMETERING SYSTEM.

Alternate Parts: XDS560V2, XDS-560V2, 6625-01-620-1148, 01-620-1148, 6625016201148, 016201148

Supply Group (FSG) NSN Assigned NIIN Item Name Code (INC)
66JUL 02, 201301-620-114861201 ( TEST SET, ELECTRONIC SYSTEMS )
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-620-1148
Part Number Cage Code Manufacturer
XDS-560V21XVW7EWA TECHNOLOGIES, INC.
Technical Data | NSN 6625-01-620-1148
Characteristic Specifications
TEST TYPE FOR WHICH DESIGNEDSYSTEM TRACE FOR TI DEVICES
SPECIAL FEATURESPOWER OVER USB; ADDITIONAL DEDICATED LED'S; LAN AND USB GRAPHICAL CONFIGURATION AND DIAGNOSTIC TOOL; FLEXIBLE 12.5 INCH CABLE; INCLUDES 20-PIN COMPACT TI (CTI), 14-PIN STANDARD TI AND 20-PIN ARM ADAPTERS; AUTO-ADAPTABLE TCLOCK UP TO 50MHZ; AUTO-SENSING TARGET VOLTAGE RANGE FROM 1.2-4.1 VOLT; JTAG DEBUG ISOLATION; UP TO 100 MHZ EXPORT CLOCK; AUTO COMPENSATING CALIBRATION; ADAPTIVE RECEIVER FOR SETUP/HOLD TIMES UP TO 1.5NS; SUPPORTS JTAG 1149.1 AND 1149.7, 1-4 PIN SYSTEM TRACE WITH 128 MB OF SYSTEM TRACE BUFFER, MOBILE INDUSTRY PROCESSOR INTERFACE SYSTEM TRACE PROTOCOL AND HIGH SPEED PARALLEL TRACE