NSN 6625-01-644-5784
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-01-644-5784 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: P563193, F178703 ITEM 30, 6625-01-644-5784, 01-644-5784, 6625016445784, 016445784
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | MAY 12, 2015 | 01-644-5784 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-01-644-5784
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| P563193 | 18265 | DONALDSON COMPANY, INC. |
| F178703 ITEM 30 | 34712 | OLDENBURG GROUP INCORPORATEDDBA OLDENBURG - LAKE SHORE |
Technical Data | NSN 6625-01-644-5784
| Characteristic | Specifications |
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